LPC: An Error Correction Code for Mitigating Faults in 3D Memories

The radiation sensitivity of memory cells increases dramatically as CMOS manufacture technology scales down; therefore, the reliability of memories has become a challenge. 3D technology has gained attention for having several advantages compared to the 2D counterpart, such as high integration density, high performance, low power, and high communication speed. Although several studies are targeting 3D memories, the effects on reliability using...