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Temperature- and thickness-dependence of robust out-of-plane ferroelectricity in CVD grown ultrathin van der Waals α-In2Se3 layers
Paper Details
Title
Temperature- and thickness-dependence of robust out-of-plane ferroelectricity in CVD grown ultrathin van der Waals α-In2Se3 layers
Published Date
Jan 15, 2020
Journal
Volume
13
Issue
7
Pages
1897 - 1902
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Notes
History