Generalized Heterodyne Configurations for Photoinduced Force Microscopy
Abstract
Infrared chemical microscopy through mechanical probing of light–matter interactions by atomic force microscopy (AFM) bypasses the diffraction limit. One increasingly popular technique is photoinduced force microscopy (PiFM), which utilizes the mechanical heterodyne signal detection between cantilever mechanical resonant oscillations and the photoinduced force from the light–matter interaction. So far, PiFM has been operated in only one...
Paper Details
Title
Generalized Heterodyne Configurations for Photoinduced Force Microscopy
Published Date
Sep 23, 2019
Journal
Volume
91
Issue
20
Pages
13251 - 13259
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