Generalized Heterodyne Configurations for Photoinduced Force Microscopy

Infrared chemical microscopy through mechanical probing of light–matter interactions by atomic force microscopy (AFM) bypasses the diffraction limit. One increasingly popular technique is photoinduced force microscopy (PiFM), which utilizes the mechanical heterodyne signal detection between cantilever mechanical resonant oscillations and the photoinduced force from the light–matter interaction. So far, PiFM has been operated in only one...