Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification
Abstract
Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial...
Paper Details
Title
Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification
Published Date
Sep 20, 2019
Journal
Volume
8
Issue
10
Pages
1659 - 1671
Citation AnalysisPro
You’ll need to upgrade your plan to Pro
Looking to understand the true influence of a researcher’s work across journals & affiliations?
- Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
- Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.
Notes
History