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doi.org/10.1016/j.rse.2019.111410
Other
High resolution wheat yield mapping using Sentinel-2
Merryn Hunt
6
,
George Alan Blackburn
38
,
...,
Clare S. Rowland
17
View all 5 authors
Remote Sensing of Environment
11.10
Volume: 233, Pages: 111410 - 111410
Published
: Sep 7, 2019
199
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Paper Fields
Statistics
Metallurgy
Materials science
Remote sensing
Mathematics
Biology
Geography
Crop yield
Growing season
Cartography
Agronomy
Mean squared error
Scale (ratio)
Forestry
Yield (engineering)
Crop
Environmental science
Paper Details
Title
High resolution wheat yield mapping using Sentinel-2
DOI
doi.org/10.1016/j.rse.2019.111410
Published Date
Sep 7, 2019
Journal
Remote Sensing of Environment
Volume
233
Pages
111410 - 111410
Notes
History
View all history