Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research
Abstract
Infrared and optical spectroscopy represents one of the most informative methods in advanced materials research. As an important branch of modern optical techniques that has blossomed in the past decade, scattering-type scanning near-field optical microscopy (s-SNOM) promises deterministic characterization of optical properties over a broad spectral range at the nanoscale. It allows ultrabroadband optical (0.5-3000 µm) nanoimaging, and...
Paper Details
Title
Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research
Published Date
Apr 1, 2019
Journal
Volume
31
Issue
24
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