Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor

Volume: 19, Issue: 7, Pages: 1530 - 1530
Published: Mar 29, 2019
Abstract
We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool. The bimodal atomic force microscopy technique combined with a sideband coupling scheme is exploited for the high-sensitivity imaging of the...
Paper Details
Title
Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
Published Date
Mar 29, 2019
Journal
Volume
19
Issue
7
Pages
1530 - 1530
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