Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
Abstract
We present the photo-induced force microscopy (PiFM) studies of various nano-materials by implementing a quartz tuning fork (QTF), a self-sensing sensor that does not require complex optics to detect the motion of a force probe and thus helps to compactly configure the nanoscale optical mapping tool. The bimodal atomic force microscopy technique combined with a sideband coupling scheme is exploited for the high-sensitivity imaging of the...
Paper Details
Title
Photo-Induced Force Microscopy by Using Quartz Tuning-Fork Sensor
Published Date
Mar 29, 2019
Journal
Volume
19
Issue
7
Pages
1530 - 1530
Citation AnalysisPro
You’ll need to upgrade your plan to Pro
Looking to understand the true influence of a researcher’s work across journals & affiliations?
- Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
- Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.
Notes
History