The improvement of the accuracy of electromagnetic actuator based atomic force microscope operating in contact mode and the development of a new methodology for the estimation of control parameters and the achievement of superior image quality

The dynamics of atomic force microscope (AFM) acting in contact mode is crucial for correct interpretation of AFM images and especially for the identification of artefacts and the determination of their sources. This paper presents a methodology for the interpretation and improvement of the AFM image quality. The developed AFM dynamic model has been applied for the control of scanning parameters to achieve superior image quality. The model...