Damage to passivation contact in silicon heterojunction solar cells by ITO sputtering under various plasma excitation modes

Analysis of damage to passivation contact in heterojunction with intrinsic thin layer (HIT) solar cells by indium tin oxide (ITO) sputtering under various plasma excitation modes such as radio frequency (RF), direct current (DC), RF-superimposed DC, pulsed DC is presented. A significant degradation of effective minority carrier lifetime of the precursor cells at both low and high-level injections after the ITO deposition by sputtering technique...