Measurement and evaluation of the defects in Cd1−xZnxTe materials by observing their etch pits in real time

An improved chemical etching method named as etch pit real-time observation (EPRTO) method was proposed for the measurement and evaluation of the defects in Cd1−xZnxTe materials. Unlike the traditional defect chemical etching method in which the etch pits (EPs) are measured after etching with a fixed time, by using EPRTO method, the EPs can be characterized while etching. A special etching apparatus is designed to observe and record the whole...