Microstructural evolution and electrical resistivity of nanocrystalline W thin films grown by sputtering
Abstract
Tungsten (W) thin films and nanostructures, particularly those having a beta (β)-phase, have attracted a large amount of attention lately because an ultrathin β-phase W film attached to a ferromagnetic layer can reverse the direction of magnetization upon current injection. However, in-depth microstructural studies including the phase transformation in W films as a function of thickness and post-deposition heat treatment temperature are rare....
Paper Details
Title
Microstructural evolution and electrical resistivity of nanocrystalline W thin films grown by sputtering
Published Date
Nov 1, 2018
Journal
Volume
145
Pages
473 - 478
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Notes
History