doi.org/10.1016/j.mssp.2018.06.025

Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials

,

M. Kamal Warshi

,

..., Pankaj R. Sagdeo

Materials Science in Semiconductor Processing4.60

Volume: 86, Pages: 151 - 156

Published: Jul 4, 2018

Paper Fields

Paper Details

Title

Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials

DOI

doi.org/10.1016/j.mssp.2018.06.025

Published Date

Jul 4, 2018

Journal

Materials Science in Semiconductor Processing

Volume

86

Pages

151 - 156

Notes

History