The etiology of oxidative stress in insulin resistance

Volume: 40, Issue: 5, Pages: 257 - 262
Published: Oct 1, 2017
Abstract
Insulin resistance is a prevalent syndrome in developed as well as developing countries. It is the predisposing factor for type 2 diabetes mellitus, the most common end stage development of metabolic syndrome in the United States. Previously, studies investigating type 2 diabetes have focused on beta cell dysfunction in the pancreas and insulin resistance, and developing ways to correct these dysfunctions. However, in recent years, there has...
Paper Details
Title
The etiology of oxidative stress in insulin resistance
Published Date
Oct 1, 2017
Volume
40
Issue
5
Pages
257 - 262
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