Probe reconstruction for holographic X-ray imaging

In X-ray holographic near-field imaging the resolution and image quality depend sensitively on the beam. Artifacts are often encountered due to the strong focusing required to reach high resolution. Here, two schemes for reconstructing the complex-valued and extended wavefront of X-ray nano-probes, primarily in the planes relevant for imaging ( i.e. focus, sample and detection plane), are presented and compared. Firstly, near-field ptychography...