Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy
Abstract
Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-dimensional information about solid materials with a resolution of a few nanometres and thus bridges the gap between X-ray and transmission electron microscopic tomography techniques. This contribution serves as an introduction and overview of FIB-SEM tomography applied to porous materials. Using two different porous Earth materials, a diatomite...
Paper Details
Title
Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy
Published Date
Oct 10, 2016
Journal
Volume
6
Issue
4
Pages
104 - 104
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