Uncertainty Quantification for Robust Topology Optimization of Power Transistor Devices

In this paper, we focus on incorporating a stochastic collocation method (SCM) into a topological shape optimization of a power semiconductor device, including material and geometrical uncertainties. This results in a stochastic direct problem and, in consequence, affects the formulation of an optimization problem. In particular, our aim is to minimize the current density overshoots, since the change of the shape and topology of a device layout...