An atomic force microscope tip designed to measure time-varying nanomechanical forces.

Volume: 2, Issue: 8, Pages: 507 - 514
Published: Aug 1, 2007
Abstract
Tapping-mode atomic force microscopy (AFM), in which the vibrating tip periodically approaches, interacts and retracts from the sample surface, is the most common AFM imaging method. The tip experiences attractive and repulsive forces that depend on the chemical and mechanical properties of the sample, yet conventional AFM tips are limited in their ability to resolve these time-varying forces. We have created a specially designed cantilever tip...
Paper Details
Title
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
Published Date
Aug 1, 2007
Volume
2
Issue
8
Pages
507 - 514
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