An electronic speckle pattern interferometer for two-dimensional strain measurement

Volume: 7, Issue: 12, Pages: 1740 - 1747
Published: Dec 1, 1996
Abstract
We describe an electronic speckle pattern interferometer devised to measure orthogonal in-plane strain components simultaneously and automatically. The interferometer is based on an earlier system that measured two in-plane displacement components simultaneously. Automatic displacement analysis is achieved using a phase-stepping technique. The surface strain is then calculated by numerical differentiation of the displacement data. Simultaneous...
Paper Details
Title
An electronic speckle pattern interferometer for two-dimensional strain measurement
Published Date
Dec 1, 1996
Volume
7
Issue
12
Pages
1740 - 1747
Citation AnalysisPro
  • Scinapse’s Top 10 Citation Journals & Affiliations graph reveals the quality and authenticity of citations received by a paper.
  • Discover whether citations have been inflated due to self-citations, or if citations include institutional bias.