A Novel Batch Cooling Crystallizer for in Situ Monitoring of Solution Crystallization Using Energy Dispersive X-ray Diffraction
Abstract
In situ X-ray diffraction monitoring of crystallization from solution is often hampered by a combination of the rather low levels of crystallized solid (typically 5 to 20 wt %) and the large background scattering that arises from the solution phase. In this work, we have attempted to overcome these limitations, first, by using high intensity dispersive X-rays available at the Synchrotron Radiation Source, Daresbury Laboratory, UK, and second by...
Paper Details
Title
A Novel Batch Cooling Crystallizer for in Situ Monitoring of Solution Crystallization Using Energy Dispersive X-ray Diffraction
Published Date
Feb 6, 2003
Journal
Volume
3
Issue
2
Pages
197 - 201
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