Recent developments and applications in electronic speckle pattern interferometry

Electronic speckle pattern interferometry (ESPI) is a wholefield non-contact optical metrology technique for displacement measurement, based on the optical physics of surface-generated laser speckle. Since its inception during the early 1970s ESPI has gradually evolved into different optical designs and has been applied to a range of engineering and non-engineering applications. Development of ESPI has continued during the 1990s with the...