Defect structures at thin film-substrate interfaces

Volume: 45, Issue: 5, Pages: 637 - 665
Published: May 1, 1997
Abstract
We consider the loss of lattice coherence at a planar interface between a thin film and substrate. Coherence is determined locally at the interface by a relative deformation gradient at the interface. We construct an interfacial free energy density fxs such that a fully coherent interface is a global minimizer fxs, and there are symmetry related local minima of fxs corresponding to line defects at the interface. By considering both the...
Paper Details
Title
Defect structures at thin film-substrate interfaces
Published Date
May 1, 1997
Volume
45
Issue
5
Pages
637 - 665
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