Study on constant-step stress accelerated life tests in white organic light-emitting diodes
Abstract
In order to obtain reliability information for a white organic light-emitting diode (OLED), two constant and one step stress tests were conducted with its working current increased. The Weibull function was applied to describe the OLED life distribution, and the maximum likelihood estimation (MLE) and its iterative flow chart were used to calculate shape and scale parameters. Furthermore, the accelerated life equation was determined using the...
Paper Details
Title
Study on constant-step stress accelerated life tests in white organic light-emitting diodes
Published Date
Feb 20, 2014
Journal
Volume
29
Issue
7
Pages
933 - 937
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